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di rice se [63 articles]

Articoli aggiunti di recente alla biblioteca di rice classificati sotto il tag se. You can also see everyone's se.
  • Laser infrared photothermal radiometry of semiconductors: principles and applications to solid state electronics
    Solid-State Electronics, Vol. 42, No. 1. (January 1998), pp. 1-15.
    by Andreas Mandelis
    posted to se by rice on 2008-04-24 04:54:05 as **
  • Microelectronic circuit characterization via photothermal radiometry of scribeline recombination lifetime
    Solid-State Electronics, Vol. 44, No. 4. (1 April 2000), pp. 703-711.
    by ME Rodriguez, A Mandelis, G Pan, JA Garcia, Y Riopel
    posted to se by rice on 2008-04-24 04:53:48 as **
  • The effect of recoiled oxygen on damage regrowth and electrical properties of through-oxide implanted Si
    Nuclear Instruments and Methods in Physics Research, Vol. 209-210, No. Part 2., pp. 743-750.
    by DK Sadana, NR Wu, J Washburn, M Current, A Morgan, D Reed, M Maenpaa
    posted to se by rice on 2008-04-24 04:53:46 as **
  • Ion implantation induced buried disorder studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry
    Vacuum, Vol. 50, No. 3-4. (1 July 1998), pp. 487-490.
    by T Lohner, P Petrik, O Polgár, NQ Khánh, M Fried, J Gyulai
    posted to se by rice on 2008-04-24 04:53:44 as **
  • Ion implantation-caused damage depth profiles in single-crystalline silicon studied by Spectroscopic Ellipsometry and Rutherford Backscattering Spectrometry
    Vacuum, Vol. 50, No. 3-4. (1 July 1998), pp. 293-297.
    by P Petrik, O Polgár, T Lohner, M Fried, NQ Khánh, J Gyulai
    posted to se by rice on 2008-04-24 04:53:42 as **
  • Infrared reflectance spectra of semi-transparent SiO2 rich films on silicate glasses: influence of the substrate and film thickness
    Journal of Non-Crystalline Solids, Vol. 321, No. 1-2. (15 June 2003), pp. 110-119.
    by Franco Geotti-Bianchini, Martina Preo, Massimo Guglielmi, Carlo G Pantano
    posted to se by rice on 2008-04-24 04:53:37 as **
  • IR spectroscopic ellipsometry: instrumentation and results
    Thin Solid Films, Vol. 234, No. 1-2. (25 October 1993), pp. 307-313.
    by A Röseler
    posted to se by rice on 2008-04-24 04:53:35 as **
  • IR spectroscopic ellipsometry: instrumentation and applications in semiconductors
    Thin Solid Films, Vol. 234, No. 1-2. (25 October 1993), pp. 356-362.
    by Gilbert Zalczer, Olivier Thomas, Jean-Philippe Piel, Jean-Louis Stehlé
    posted to se by rice on 2008-04-24 04:53:33 as **
  • Experimental Investigation on the Reliability of Thermal Wave Interferometry in the Thermophysical Characterization of Plasma Sprayed Coatings
    International Journal of Thermophysics, Vol. 26, No. 3. (May 2005), pp. 881-892.
    by A Bendada, N Baddour, A Mandelis, C Moreau
    posted to se by rice on 2008-04-24 04:49:54 as **
  • In-situ monitor and control using fast spectroscopic ellipsometry
    International Symposium on Polarization Analysis and Applications to Device Technology, Vol. 2873, No. 1. (1996), pp. 140-143.
    by John A Woollam, Xiang Gao, Scott Heckens, James N Hilfiker
    edited by Toru Yoshizawa, Hideshi Yokota
    posted to se by rice on 2008-04-24 04:46:05 as **
  • Infrared spectroscopic ellipsometry in semiconductor manufacturing
    Metrology, Inspection, and Process Control for Microlithography XVIII, Vol. 5375, No. 1. (2004), pp. 771-778.
    by Pierre Y Guittet, Ulrich Mantz, Peter Weidner, Jean L Stehle, Marc Bucchia, Sophie Bourtault, Dorian Zahorski
    edited by Richard M Silver
    posted to se by rice on 2008-04-24 04:45:57 as **
  • Far-IR spectroscopic ellipsometer
    Thin Solid Films, Vol. 234, No. 1-2. (25 October 1993), pp. 314-317.
    by Barth, D Böhme, K Kamaräs, F Keilmann, M Cardona
    posted to se by rice on 2008-04-24 04:42:50 as **
  • Ellipsometry in the Study of Dynamic Material Properties
    Shock Compression of Condensed Matter - 2001: 12th APS Topical Conference, Vol. 620, No. 1. (2002), pp. 1247-1250.
    by Andrew W Obst, Keith R Alrick, William W Anderson, Konstantinos Boboridis, William T Buttler, Steve K Lamoreaux, Bruce R Marshall, Stefanie L Montgomery, Jeremy R Payton, Mark D Wilke
    edited by Michael D Furnish, Naresh N Thadhani, Yasuyuki Horie
    posted to se by rice on 2008-04-24 04:42:00 as **
  • Ellipsometric measurement of the optical properties and electrical conductivity of indium tin oxide thin films
    Optical Interference Coatings, Vol. 2253, No. 1. (1994), pp. 962-968.
    by John A Woollam, William A Mcgahan, Blaine D Johs
    edited by Florin Abeles
    posted to se by rice on 2008-04-24 04:38:33 as **
  • Ellipsometric characterization techniques for Si processing technologies
    Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II, Vol. 2638, No. 1. (1995), pp. 138-146.
    by Teruaki Motooka, T Iwanaga, M Koutani
    edited by John K Lowell, Ray T Chen, Jagdish P Mathur
    posted to se by rice on 2008-04-24 04:37:51 as **
  • Characterization of polycrystalline silicon thin-film multilayers by variable angle spectroscopic ellipsometry
    Surface and Interface Analysis, Vol. 18, No. 2. (1992), pp. 113-118.
    by Paul G Snyder, Yi-Ming Xiong, John A Woollam, Eric R Krosche, Yale Strausser
    posted to se by rice on 2008-04-24 04:30:58 as **
  • Application of spectroscopic ellipsometry to characterization of optical thin films
    Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, Vol. 4932, No. 1. (2003), pp. 393-404.
    by John A Woollam, Corey L Bungay, Li Yan, Daniel W Thompson, James N Hilfiker
    edited by Gregory J Exarhos, Arthur H Guenther, Norbert Kaiser, Keith L Lewis, MJ Soileau, Christopher J Stolz, Adolf Giesen, Horst Weber
    posted to se by rice on 2008-04-24 04:30:36 as **
  • Characterization of optical blacks by infrared ellipsometry and reflectometry
    Stray Radiation in Optical Systems, Vol. 1331, No. 1. (1990), pp. 249-260.
    by Soe, Harold E Bennett
    edited by Robert P Breault
    posted to se by rice on 2008-04-24 04:28:17 as **
  • An adaptive multiscale inverse scattering approach to photothermal depth profilometry
    Circuits, Systems, and Signal Processing, Vol. 19, No. 4. (1 July 2000), pp. 339-363.
    by Eric L Miller, Ibrahim Yavuz, Lena Nicolaides, Andreas Mandelis
    posted to se by rice on 2008-04-24 04:23:22 as **
  • Visible and infrared optical constants of electrochromic materials for emissivity modulation applications
    Thin Solid Films, Vol. 313-314 (13 February 1998), pp. 205-209.
    by Jeffrey S Hale, Michael Devries, Brad Dworak, John A Woollam
    posted to se by rice on 2008-04-24 04:21:43 as **
  • Visible and infrared ellipsometry study of ion assisted SiO2 films
    Thin Solid Films, Vol. 313-314 (13 February 1998), pp. 676-681.
    by D Souche, A Brunet-Bruneau, S Fisson, Nguyen, G Vuye, F Abeles, J Rivory
    posted to se by rice on 2008-04-24 04:21:41 as **
  • VASE and IR spectroscopy: excellent tools to study biaxial organic molecular thin films: DiMe-PTCDI on S-passivated GaAs(100)
    Thin Solid Films, Vol. 455-456 (1 May 2004), pp. 586-590.
    by M Friedrich, C Himcinschi, G Salvan, M Anghel, A Paraian, Th Wagner, TU Kampen, DRT Zahn
    posted to se by rice on 2008-04-24 04:21:38 as **
  • The growth and characterization of photonic thin films
    Vacuum, Vol. 80, No. 1-3. (14 October 2005), pp. 12-19.
    by JT Grant, Hao Jiang, S Tullis, WE Johnson, K Eyink, P Fleitz, TJ Bunning
    posted to se by rice on 2008-04-24 04:21:36 as **
  • Assignment of surface IR absorption spectra observed in the oxidation reactions: 2H + H2O/Si(1 0 0) and H2O + H/Si(1 0 0)
    Surface Science, Vol. 575, No. 3. (1 February 2005), pp. 330-342.
    by Zhi-Hong Wang, Tsuneo Urisu, Hidekazu Watanabe, Kenta Ooi, Ranga, Shinkoh Nanbu, Jun Maki, Mutsumi Aoyagi
    posted to se by rice on 2008-04-24 04:19:45 as **
  • Study of mechanism of plasma surface modifications in Si by spectroscopic ellipsometry
    Surface and Coatings Technology, Vol. 174-175 ( 2003), pp. 854-857.
    by T Yamada, N Harada, K Kitahara, A Moritani
    posted to se by rice on 2008-04-24 04:19:41 as **
  • Structure and optical properties of porous silicon prepared on thin epitaxial silicon layer on silicon substrates
    Journal of Molecular Structure, Vol. 834-836 (27 May 2007), pp. 465-470.
    by M Balarin, O Gamulin, M Ivanda, V Djerek, O Celan, S Music, M Ristic, K Furic
    posted to se by rice on 2008-04-24 04:19:39 as **
  • Structure analysis of organic films by mid-infrared ellipsometry
    Thin Solid Films, Vol. 455-456 (1 May 2004), pp. 266-271.
    by K Hinrichs, A Röseler, M Gensch, EH Korte
    posted to se by rice on 2008-04-24 04:19:36 as **
  • Spectroscopic ellipsometry studies on BN films from IR to vacuum UV energy region
    Diamond and Related Materials, Vol. 11, No. 3-6. ( 2002), pp. 1281-1285.
    by Y Panayiotatos, S Logothetidis, A Laskarakis, A Zervopoulou, M Gioti
    posted to se by rice on 2008-04-24 04:19:35 as **
  • Spectroscopic ellipsometry and biology: recent developments and challenges
    Thin Solid Films, Vol. 313-314 (13 February 1998), pp. 764-774.
    by H Arwin
    posted to se by rice on 2008-04-24 04:19:33 as **
  • Spectroscopic ellipsometry: a historical overview
    Thin Solid Films, Vol. 313-314 (13 February 1998), pp. 1-9.
    by K Vedam
    posted to se by rice on 2008-04-24 04:19:29 as **
  • Si nanocrystals in silicon nitride: An ellipsometric study using parametric semiconductor models
    Physica E: Low-dimensional Systems and Nanostructures, Vol. 38, No. 1-2. (April 2007), pp. 76-79.
    by P Basa, P Petrik, M Fried, L Dobos, B Pécz, L Tóth
    posted to se by rice on 2008-04-24 04:19:27 as **
  • Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry
    Thin Solid Films, Vol. 364, No. 1-2. (27 March 2000), pp. 129-137.
    by RW Collins, Joohyun Koh, AS Ferlauto, PI Rovira, Yeeheng Lee, RJ Koval, CR Wronski
    posted to se by rice on 2008-04-24 04:19:26 as **
  • Raman scattering, photoluminescence and spectroscopic ellipsometry studies on polycrystalline Cd0.96Zn0.04Te thin films
    Journal of Alloys and Compounds, Vol. 346, No. 1-2. (18 November 2002), pp. 100-106.
    by M Sridharan, Sa Narayandass, D Mangalaraj, Hee C Lee
    posted to se by rice on 2008-04-24 04:19:22 as **
  • Process monitoring of semiconductor thin films and interfaces by spectroellipsometry
    Applied Surface Science, Vol. 154-155 (1 February 2000), pp. 283-290.
    by R Brenot, B Drévillon, P Bulkin, Roca, R Vanderhaghen
    posted to se by rice on 2008-04-24 04:19:20 as **
  • Phosphorus doping and deposition pressure effects on optical and electrical properties of polysilicon
    Materials Science and Engineering: C, Vol. 26, No. 2-3. (March 2006), pp. 177-180.
    by M Zaghdoudi, MM Abdelkrim, M Fathallah, T Mohammed-Brahim, R Rogel
    posted to se by rice on 2008-04-24 04:19:17 as **
  • Performance analysis of ellipsometer systems
    Thin Solid Films, Vol. 455-456 (1 May 2004), pp. 790-793.
    by Leo Asinovski
    posted to se by rice on 2008-04-24 04:19:14 as **
  • Optical characterization of polysilicon thin films for solar applications
    Solar Energy, Vol. 80, No. 6. (June 2006), pp. 667-674.
    by J Müllerová, S Jurecka, P Sutta
    posted to se by rice on 2008-04-24 04:11:49 as **
  • Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV-visible-near IR ellipsometry
    Thin Solid Films, Vol. 313-314 (13 February 1998), pp. 108-113.
    by M Kildemo, R Ossikovski, M Stchakovsky
    posted to se by rice on 2008-04-24 04:11:48 as **
  • Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV
    Thin Solid Films, Vol. 388, No. 1-2. (1 June 2001), pp. 283-289.
    by E Franke, M Schubert, CL Trimble, MJ Devries, JA Woollam
    posted to se by rice on 2008-04-24 04:11:26 as **
  • Optical characterization of wide bandgap semiconductors
    Thin Solid Films, Vol. 364, No. 1-2. (27 March 2000), pp. 98-106.
    by NV Edwards, MD Bremser, AD Batchelor, IA Buyanova, LD Madsen, SD Yoo, T Wethkamp, K Wilmers, C Cobet, N Esser, RF Davis, DE Aspnes, B Monemar
    posted to se by rice on 2008-04-24 04:11:19 as **
  • Optical characterization of diamond-like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry
    Diamond and Related Materials, Vol. 11, No. 1. (January 2002), pp. 105-117.
    by D Franta, L Zajícková, I Ohlídal, J Janca, K Veltruská
    posted to se by rice on 2008-04-24 04:11:16 as **
  • Optical analysis of coatings by variable angle spectrophotometry
    Thin Solid Films, Vol. 516, No. 14. (30 May 2008), pp. 4553-4557.
    by PA van Nijnatten
    posted to se by rice on 2008-04-24 04:11:14 as **
  • Optical absorption in amorphous InN thin films
    Journal of Non-Crystalline Solids, Vol. 352, No. 52-54. (15 December 2006), pp. 5572-5577.
    by Jebreel M Khoshman, Martin E Kordesch
    posted to se by rice on 2008-04-24 04:11:12 as **
  • Nonlinear fundamental photothermal response: experimental results for tungsten
    Solid State Communications, Vol. 114, No. 3. (21 March 2000), pp. 133-136.
    by A Salnick, J Opsal, A Rosencwaig, A Mandelis
    posted to se by rice on 2008-04-24 04:11:10 as **
  • Non-destructive optical depth profiling and real-time evaluation of spectroscopic data
    Thin Solid Films, Vol. 364, No. 1-2. (27 March 2000), pp. 64-74.
    by M Fried, L Rédei
    posted to se by rice on 2008-04-24 04:11:08 as **
  • Multimodal electronic-vibronic spectra of luminescence in ion-implanted silica layers
    Journal of Luminescence, Vol. 122-123 ( 2007), pp. 743-746.
    by Hans-Joachim Fitting, Roushdey Salh, Bernd Schmidt
    posted to se by rice on 2008-04-24 04:11:05 as **
  • Model for the amorphous roughening transition in amorphous semiconductor deposition
    Journal of Non-Crystalline Solids, Vol. 352, No. 9-20. (15 June 2006), pp. 950-954.
    by NJ Podraza, CR Wronski, RW Collins
    posted to se by rice on 2008-04-24 04:11:04 as **
  • In-situ and ex-situ ellipsometric characterization for semiconductor technology (Invited Paper)
    Spectroscopic Characterization Techniques for Semiconductor Technology IV, Vol. 1678, No. 1. (1992), pp. 246-257.
    by John A Woollam, Paul G Snyder, Walter H Yao, Blaine D Johs
    edited by Orest J Glembocki
    posted to se by rice on 2008-04-24 04:06:15 as **
  • Infrared spectroscopy of oxygen interstitials and precipitates in nitrogen-doped silicon
    Physica B: Condensed Matter, Vol. 376-377 (1 April 2006), pp. 150-153.
    by R Stoudek, J Humlícek
    posted to se by rice on 2008-04-24 04:05:54 as **
  • Infrared spectroscopic ellipsometry--a new tool for characterization of semiconductor heterostructures
    Vibrational Spectroscopy, Vol. 29, No. 1-2. (5 July 2002), pp. 121-124.
    by A Kasic, M Schubert, S Einfeldt, D Hommel
    posted to se by rice on 2008-04-24 04:05:52 as **
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